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International Symposium on Quality Electronic Design

ISQED Home Page

ISQED 2009: San Jose, California, USA

10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. IEEE 2009
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ISQED 2008: San Jose, California, USA

9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3117-5
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ISQED 2007: San Jose, California, USA

8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. IEEE Computer Society 2007, ISBN 978-0-7695-2795-6
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ISQED 2006: San Jose, California, USA

7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. IEEE Computer Society 2006, ISBN 0-7695-2523-7
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ISQED 2005: San Jose, California, USA

6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. IEEE Computer Society 2005, ISBN 0-7695-2301-3
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ISQED 2004: San Jose, California, USA

5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. IEEE Computer Society 2004, ISBN 0-7695-2093-6
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ISQED 2003: San Jose, California, USA

4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. IEEE Computer Society 2003, ISBN 0-7695-1881-8
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ISQED 2002: San Jose, California, USA

International Symposium on Quality Electronic Design, ISQED 2002, 18-21 March 2002, San Jose, California, USA. IEEE Computer Society, 2002, online publication: http://computer.org/proceedings/isqed/1561/1561toc.htm
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ISQED 2001: San Jose, California, USA

2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. IEEE Computer Society 2001, ISBN 0-7695-1025-6
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ISQED 2000: San Jose, California, USA

1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. IEEE Computer Society 2000, ISBN 0-7695-0525-2
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