| 2008 |
5 | | Siegfried F. Karg,
G. Ingmar Meijer,
J. Georg Bednorz,
Charles T. Rettner,
Alejandro G. Schrott,
Eric A. Joseph,
Chung Hon Lam,
Markus Janousch,
Urs Staub,
Fabio LaMattina,
Santos F. Alvarado,
Daniel Widmer,
Richard Stutz,
Ute Drechsler,
Daniele Caimi:
Transition-metal-oxide-based resistance-change memories.
IBM Journal of Research and Development 52(4-5): 481-492 (2008) |
4 | | Aggeliki Pantazi,
Abu Sebastian,
Theodore Antonakopoulos,
Peter Bächtold,
Anthony R. Bonaccio,
Jose Bonan,
Giovanni Cherubini,
Michel Despont,
Richard A. DiPietro,
Ute Drechsler,
Urs Dürig,
Bernd Gotsmann,
Walter Häberle,
Christoph Hagleitner,
James L. Hedrick,
Daniel Jubin,
Armin Knoll,
Mark A. Lantz,
John Pentarakis,
Haralampos Pozidis,
Russell C. Pratt,
Hugo E. Rothuizen,
Richard Stutz,
Maria Varsamou,
Dorothea Wiesmann,
Evangelos Eleftheriou:
Probe-based ultrahigh-density storage technology.
IBM Journal of Research and Development 52(4-5): 493-512 (2008) |
| 2003 |
3 | | Evangelos Eleftheriou,
Peter Bächtold,
Giovanni Cherubini,
Ajay Dholakia,
Christoph Hagleitner,
T. Loeliger,
Aggeliki Pantazi,
Haralampos Pozidis,
T. R. Albrecht,
Gerd K. Binnig,
Michel Despont,
Ute Drechsler,
Urs Dürig,
Bernd Gotsmann,
Daniel Jubin,
Walter Häberle,
Mark A. Lantz,
Hugo E. Rothuizen,
Richard Stutz,
Peter Vettiger,
Dorothea Wiesmann:
A Nanotechnology-based Approach to Data Storage.
VLDB 2003: 3-7 |
| 2001 |
2 | | Bruno Michel,
André Bernard,
Alexander Bietsch,
Emmanuel Delamarche,
Matthias Geissler,
David Juncker,
Hannes Kind,
Jean-Philippe Renault,
Hugo E. Rothuizen,
Heinz Schmid,
Patrick Schmidt-Winkel,
Richard Stutz,
Heiko Wolf:
Printing meets lithography: Soft approaches to high-resolution patterning.
IBM Journal of Research and Development 45(5): 697- (2001) |
| 2000 |
1 | | Peter Vettiger,
Michel Despont,
Ute Drechsler,
Urs Dürig,
Walter Häberle,
Mark I. Lutwyche,
Hugo E. Rothuizen,
Richard Stutz,
Roland Widmer,
Gerd K. Binnig:
The "Millipede"-More than thousand tips for future AFM storage.
IBM Journal of Research and Development 44(3): 323-340 (2000) |