| 2009 |
17 | | Alexandre Schmid,
Sanjay Goel,
Wei Wang,
Valeriu Beiu,
Sandro Carrara:
Nano-Net - 4th International ICST Conference, Nano-Net 2009, Lucerne, Switzerland, October 18-20, 2009. Proceedings
Springer 2009 |
16 | | Milos Stanisavljevic,
Alexandre Schmid,
Yusuf Leblebici:
Optimization of Nanoelectronic Systems Reliability Under Massive Defect Density Using Distributed R-fold Modular Redundancy (DRMR).
DFT 2009: 340-348 |
15 | | Milos Stanisavljevic,
Alexandre Schmid,
Yusuf Leblebici:
Optimization of Nanoelectronic Systems Reliability by Reducing Logic Depth.
NanoNet 2009: 70-75 |
14 | | Neil Joye,
Alexandre Schmid,
Yusuf Leblebici:
Electrical modeling of the cell-electrode interface for recording neural activity from high-density microelectrode arrays.
Neurocomputing 73(1-3): 250-259 (2009) |
| 2008 |
13 | | Carlotta Guiducci,
Alexandre Schmid,
Frank K. Gürkaynak,
Yusuf Leblebici:
Novel Front-End Circuit Architectures for Integrated Bio-Electronic Interfaces.
DATE 2008: 1328-1333 |
| 2007 |
12 | | Milos Stanisavljevic,
Frank K. Gürkaynak,
Alexandre Schmid,
Yusuf Leblebici,
Maria Gabrani:
Design and realization of a fault-tolerant 90nm CMOS cryptographic engine capable of performing under massive defect density.
ACM Great Lakes Symposium on VLSI 2007: 204-207 |
| 2006 |
11 | | Milos Stanisavljevic,
Alexandre Schmid,
Yusuf Leblebici:
Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density.
IJCNN 2006: 2771-2778 |
| 2005 |
10 | | Sorin Cotofana,
Alexandre Schmid,
Yusuf Leblebici,
Adrian M. Ionescu,
Oliver Soffke,
Peter Zipf,
Manfred Glesner,
A. Rubio:
CONAN - A Design Exploration Framework for Reliable Nano-Electronics.
ASAP 2005: 260-267 |
9 | | Takahide Oya,
Tetsuya Asai,
Yoshihito Amemiya,
Alexandre Schmid,
Yusuf Leblebici:
Single-electron circuit for inhibitory spiking neural network with fault-tolerant architecture.
ISCAS (3) 2005: 2535-2538 |
8 | | Milos Stanisavljevic,
Alexandre Schmid,
Yusuf Leblebici:
A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis.
VLSI-SoC 2005: 111-125 |
7 | | Takahide Oya,
Alexandre Schmid,
Tetsuya Asai,
Yusuf Leblebici,
Yoshihito Amemiya:
On the fault tolerance of a clustered single-electron neural network for differential enhancement.
IEICE Electronic Express 2(3): 76-80 (2005) |
| 2004 |
6 | | Alexandre Schmid,
Yusuf Leblebici:
A Highly Fault Tolerant PLA Architecture for Failure-Prone Nanometer CMOS and Novel Quantum Device Technologies.
DFT 2004: 39-47 |
5 | | Alexandre Schmid,
Yusuf Leblebici:
Robust and fault-tolerant circuit design for nanometer-scale devices and single-electron transistors.
ISCAS (3) 2004: 685-688 |
4 | | Stéphane Badel,
Alexandre Schmid,
Yusuf Leblebici:
Mixed analog-digital image processing circuit based on Hamming artificial neural network architecture.
ISCAS (5) 2004: 780-783 |
3 | | Alexandre Schmid,
Yusuf Leblebici:
Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors.
IEEE Trans. VLSI Syst. 12(11): 1156-1166 (2004) |
| 2003 |
2 | | Stéphane Badel,
Alexandre Schmid,
Yusuf Leblebici:
VLSI Realization of a Two-Dimensional Hamming Distance Comparator ANN for Image Processing Applications.
ESANN 2003: 445-450 |
| 1999 |
1 | | Alexandre Schmid,
D. Bowler,
R. Baumgartner,
Yusuf Leblebici:
A novel analog-digital flash converter architecture based on capacitive threshold gates.
ISCAS (2) 1999: 172-175 |